2009
Cite Score
25
AI summary
This paper introduces a suite of "invariance tests" to directly measure the invariance properties of features learned by deep learning algorithms, finding that stacked autoencoders show modest improvements with depth, while convolutional deep belief networks learn substantially more invariant features, providing insights into feature learning and evaluation.
Main Contributions
Abstract
For many pattern recognition tasks, the ideal input feature would be invariant to multiple confounding properties (such as illumination and viewing angle, in computer vision applications). Recently, deep architectures trained in an unsupervised manner have been proposed as an automatic method for extracting useful features. However, it is difficult to evaluate the learned features by any means other than using them in a classifier. In this paper, we propose a number of empirical tests that directly measure the degree to which these learned features are invariant to different input transformations. We find that stacked autoencoders learn modestly increasingly invariant features with depth when trained on natural images. We find that convolutional deep belief networks learn substantially more invariant features in each layer. These results further justify the use of “deep” vs. “shallower” representations, but suggest that mechanisms beyond merely stacking one autoencoder on top of another may be important for achieving invariance. Our evaluation metrics can also be used to evaluate future work in deep learning, and thus help the development of future algorithms.
Citation Graph
References [22]
D. E. Rumelhart, Geoffrey E. Hinton, Ronald J. Williams - 1986
34 papers in library cite
Geoffrey E. Hinton, S. Osindero, Y. Teh - 2006
43 papers in library cite
Yann Lecun, B. Boser, John S. Denker, D. Henderson, R. E. Howard, W. Hubbard, L. D. Jackal - 1989
24 papers in library cite
Yoshua Bengio, P. Lamblin, D. Popovici, Hugo Larochelle - 2006
33 papers in library cite
Li Fei Fei, Rob Fergus, Pietro Perona - 2004
15 papers in library cite
Rajat Raina, Alexis Battle, Honglak Lee, Benjamin Packer, A. Ng - 2007
7 papers in library cite
Yoshua Bengio, Yann Lecun - 2007
15 papers in library cite
Yann Lecun, Fu Jie Huang, Leon Bottou - 2004
18 papers in library cite
Marc'aurelio Ranzato, F. Huang, Y. Boureau, Yann Lecun - 2007
8 papers in library cite
Hugo Larochelle, Dumitru Erhan, Aaron Courville, James Bergstra, Yoshua Bengio - 2007
13 papers in library cite
Yann Lecun - 1985
4 papers in library cite
P. Werbos - 1974
14 papers in library cite
Honglak Lee, R. Grosse, R. Ranganath, Andrew Y. Ng - 2009
12 papers in library cite
Marc'aurelio Ranzato, Y. Boureau, Yann Lecun - 2008
12 papers in library cite
Honglak Lee, C. Ekanadham, A. Ng - 2008
10 papers in library cite
M. Riesenhuber, T. Poggio - 1999
8 papers in library cite
Hugo Larochelle, Yoshua Bengio, J. Louradour, P. Lamblin - 2009
7 papers in library cite
Kunihiko Fukushima, S. Miyake - 1982
7 papers in library cite
P. Berkes, L. Wiskott - 2005
3 papers in library cite
D. J. Felleman, D. C. V. Essen - 1991
2 papers in library cite
R. Q. Quiroga, L. Reddy, G. Kreiman, C. Koch, I. Fried - 2005
2 papers in library cite
L. Wiskott, T. Sejnowski - 2002
2 papers in library cite
Cited by
7
papers in your library
Cites
14
papers in your library
Read
on February 4, 2026
Your review
Tags
Paper Aliases
No aliases